| Abstract: | Photoluminescence (PL) spectroscopy and photoreflectance (PR)spectroscopy are very useful techniques for studying the propertiesof materials. In this paper, the same material of Cu-richmetal-organic vapour phase epitaxy (MOVPE) grown CuGaSephotoluminescence,photoreflectance, comparison, CuGaSephotoluminescence,photoreflectance, comparison, CuGaSephotoluminescence,photoreflectance, comparison, CuGaSe$_{2}$Project supportedby the National Natural Science Foundation of China (Grant Nos50405025 and 50535030) and the Program for New CenturyExcellent Talents in University.7860, 7865Photoluminescence (PL) spectroscopy and photoreflectance (PR)spectroscopy are very useful techniques for studying the propertiesof materials. In this paper, the same material of Cu-richmetal-organic vapour phase epitaxy (MOVPE) grown CuGaSephotoluminescence,photoreflectance, comparison, CuGaSephotoluminescence,photoreflectance, comparison, CuGaSe$_{2}$Project supportedby the National Natural Science Foundation of China (Grant Nos50405025 and 50535030) and the Program for New CenturyExcellent Talents in University.7860, 7865Photoluminescence (PL) spectroscopy and photoreflectance (PR)spectroscopy are very useful techniques for studying the propertiesof materials. In this paper, the same material of Cu-richmetal-organic vapour phase epitaxy (MOVPE) grown CuGaSe$_{2}$ layeris investigated in a temperature range from 20 to 300,K to comparethese two techniques. Both PL and PR spectra appear red shifted, lessintense and broadened. The temperature dependence of interbandtransitions is studied by using the Manoogian--Leclerc equation. Thevalues of the band gap energy at $T$=0,K and the effective phonontemperature are estimated. The temperature dependences of intensitiesand broadenings of PL and PR spectral lines are also analysed. Basedon the results of the comparison, the features and applications ofthe PL and PR can be shown in detail. |
