Multiple ionization and the charge state evolution of ions exposed to electron impact |
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| Affiliation: | 1. Faculty of Metals Engineering and Industrial Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, Krakow 30-059, Poland;2. Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, Krakow 30-059, Poland;3. Academic Center for Materials and Nanotechnology, AGH University of Science and Technology, al. Mickiewicza 30, Krakow 30-059, Poland |
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| Abstract: | Charge state abundances of atoms exposed to an electron flux for a time t are calculated from experimental cross sections by considering either electron impact single ionization only or by including multiple ionization. When multiple ionization is neglected Xeq+ ion abundances (q = 0,1,…,6) for an electron energy of 700 eV are off by a factor of up to 2 both in peak size and in time necessary to reach the peak value. |
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