首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Total ion chromatographic fingerprints combined with chemometrics and mass defect filter to predict antitumor components of Picrasma quassioids
Authors:Yuanyuan Shi  Hao Zhan  Liuyi Zhong  Fangrong Yan  Wenyuan Liu  Ning Xie
Institution:1. Department of Pharmaceutical Analysis, China Pharmaceutical University, Nanjing, China;2. Research Center of Biostatistics and Computational Pharmacy, China Pharmaceutical University, Nanjing, China;3. Department of Analytical Chemistry, China Pharmaceutical University, Nanjing, China;4. Key Laboratory of Drug Quality Control and Pharmacovigilance (China Pharmaceutical University), Ministry of Education, Nanjing, China;5. Jiangxi Qingfeng Pharmaceutical Group, Ganzhou, China
Abstract:A method of total ion chromatogram combined with chemometrics and mass defect filter was established for the prediction of active ingredients in Picrasma quassioides samples. The total ion chromatogram data of 28 batches were pretreated with wavelet transformation and correlation optimized warping to correct baseline drifts and retention time shifts. Then partial least squares regression was applied to construct a regression model to bridge the total ion chromatogram fingerprints and the antitumor activity of P. quassioides. Finally, the regression coefficients were used to predict the active peaks in total ion chromatogram fingerprints. In this strategy, mass defect filter was employed to classify and characterize the active peaks from a chemical point of view. A total of 17 constituents were predicted as the potential active compounds, 16 of which were identified as alkaloids by this developed approach. The results showed that the established method was not only simple and easy to operate, but also suitable to predict ultraviolet undetectable compounds and provide chemical information for the prediction of active compounds in herbs.
Keywords:Fingerprints  Liquid chromatography‐mass spectrometry  Picrasma quassioides  Total ion chromatogram
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号