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High-precision sample stage for photoemission microscopy of organic films
Authors:I Yamamoto  N Matsuura  K Miyakubo  T Yamada  T Munakata  
Institution:aGraduate School of Science, Osaka University, Toyonaka, Osaka 560-0043, Japan
Abstract:A high-precision sample stage for photoemission microscopy has been constructed to translate the sample by ±3 mm with accuracy better than 100 nm. The stage is actuated by step motors settled outside the vacuum. The accuracies of the translations were measured by observing a standard patterned sample with a photoemission electron microscope (PEEM) of 50 nm resolution. The accuracy was nearly independent of the distance of each translation step and the error was not accumulated by repeated steps. After round-trip translations up to 0.2 mm, the sample came back to the original position with accuracy of ±50 nm. The performance of the stage was demonstrated by observing growth processes of lead phthalocyanine (PbPc) films formed on graphite.
Keywords:Photoemission electron microscopy (PEEM)  Photoemission microspectroscopy  Electronic structure  Thin film growth  Organic semiconductor  Phthalocyanine
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