Saturation magnetization of MnBi films with different thicknesses and composition |
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Authors: | K. Kempter I. Maurer H. Harms |
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Affiliation: | (1) Siemens AG, Forschungslaboratorien, D-8000 München 80, Germany |
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Abstract: | The saturation magnetization of MnBi films in the low-temperature phase and the quenched high-temperature phase was measured at room temperature by a new method recently described. The measurements were performed with samples of varying thickness and composition (ratio Mn:Bi). The results obtained show no dependence either on film thickness or on composition. Hence, the different magnetization values given in the literature for bulk and thin film samples of the quenched high-temperature phase must not be attributed to a thickness dependence of the samples or to stoichiometric variations. This work has been supported by the data processing program of the Federal Department of Research and Technology of the FRG. The authors alone are responsible for the contents. |
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