Development of Scanning Near-Field Optical Microscope Working under Cryogenic Temperature and Strong Magnetic Field |
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Authors: | Akihiro Kirihara Shunsuke Kono Akihisa Tomita Kazuo Nakamura |
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Institution: | (1) Fundamental and Environmental Research Laboratories, NEC corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan;(2) National Institute for Material Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan |
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Abstract: | We report on the development of a cantilever-based scanning near-field optical microscope (SNOM) working in an extreme environment,
at cryogenic temperature around 10 K and under strong magnetic field up to 7 T. We designed a new optical system based on
an infinite conjugate microscope, which extracts the near-field signal from a small aperture through a narrow chamber into
free space as collimated light. Using this system, we successfully measured near-field and topographical images of a metal-hole
sample simultaneously. Combining the local optical accessing technique with the external control of the electronic state,
this SNOM system will be a powerful tool to study optical properties of semiconductor nanostructures. |
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Keywords: | SNOM AFM cantilever magnetic field quantum dot quantum device |
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