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| 基于路径遍历算法的SoC总线测试矢量集压缩 | |
| 引用本文： | 张金艺,王春华,丁梦玲,吴玉见,段苏阳.基于路径遍历算法的SoC总线测试矢量集压缩[J].微电子学,2012,42(3):426-431. |
| 作者姓名： | 张金艺 王春华 丁梦玲 吴玉见 段苏阳 |
| 作者单位： | 1. 上海大学特种光纤与光接入网省部共建教育部重点实验室,上海200072;上海大学微电子研究与开发中心,上海200072;上海大学教育部新型显示与系统应用重点实验室,上海200072 2. 上海大学特种光纤与光接入网省部共建教育部重点实验室,上海200072;上海大学教育部新型显示与系统应用重点实验室,上海200072 3. 上海大学微电子研究与开发中心,上海,200072 |
| 基金项目： | 上海市科委“上海—应用材料研究与发展”国际合作基金资助项目 |
| 摘 要： | 多跳变(MT)故障模型是目前提出的具有完整故障覆盖率的一种总线测试故障模型,但其测试矢量集存在严重的矢量冗余。提出了一个基于路径遍历算法的测试矢量压缩方法,以MT模型为基础,经压缩简化后得到更适用于SoC总线测试的BMTC故障模型。实验结果表明,使用提出的压缩方法,可以在保证MT模型故障覆盖率不变的情况下,将测试矢量数减少至原来的1/8,从而大大节省总线测试成本,提高测试效率。 |
| 关 键 词： | 总线测试 信号完整性 故障模型 测试矢量集压缩 |
Compression of Testing Vector Sets on SoC Bus Based on Path Traversing Algorithm |
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| ZHANG Jinyi , WANG Chunhua , DING Mengling , WU Yujian , DUAN Suyang.Compression of Testing Vector Sets on SoC Bus Based on Path Traversing Algorithm[J].Microelectronics,2012,42(3):426-431. | |
| Authors: | ZHANG Jinyi WANG Chunhua DING Mengling WU Yujian DUAN Suyang |
| Institution: | 1,3(1.Key Lab of Special Fiber Optics and Optical Access Networks(Ministry of Education),Shanghai Univ.,Shanghai 200072,P.R.China; 2.Microelectronics Research & Development Center,Shanghai University,Shanghai 200072,P.R.China; 3.Key Lab of Advanced Displays and System Application(Ministry of Education),Shanghai Univ.,Shanghai 200072,P.R.China) |
| Abstract: | Multiple transition(MT) fault model was an effective bus testing fault model with high fault coverage.However,its testing vector sets have serious redundancy vectors.A comprehensive method of testing vector compression was proposed,and MT fault model was simplified into a bus multiple transition compression(BMTC) fault model,which was more suitable for SoC bus testing.Experimental results showed that,using the proposed method,the testing vector number was reduced to 1/8 of the original with the same fault coverage of MT fault model,which greatly cut down test cost and improved test efficiency. |
| Keywords: | Bus testing Signal integrity Fault model Testing vector set compression |
| 本文献已被 CNKI 万方数据 等数据库收录！ | |