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| 单片微波功率放大器的极限评估试验研究 | |
| 引用本文： | 付琬月,董宇亮,张洪伟,方园.单片微波功率放大器的极限评估试验研究[J].微电子学,2012,42(4):596-600. |
| 作者姓名： | 付琬月 董宇亮 张洪伟 方园 |
| 作者单位： | 1. 电子科技大学物理电子学院,成都,610054 2. 中国空间技术研究院,北京,100029 3. 中国电子科技集团公司第十三研究所,石家庄,050051 |
| 基金项目： | 中央高校基本科研业务费专项资金资助 |
| 摘 要： | 研究了极限评估试验技术,选用国内某款GaAs MMIC功率放大器芯片,分析了器件的详细规范、关键参数、极限判据等信息,设计了高温极限评估试验和电压应力极限评估试验的试验剖面,考察器件在热、电应力下的极限能力和失效模式,并对极限评估试验的技术手段进行了实验验证。实验结果表明,极限评估试验技术能有效评价两组试验器件的各类极限,通过试验可以获得器件的失效模式,以及器件的可靠性裕度,为改进元器件设计、材料和工艺提供依据。 |
| 关 键 词： | 极限评估 GaAs MMIC 功率放大器 失效模式 |
Experiment Study on Limit Assessment of GaAs MMIC Power Amplifier |
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| FU Wanyue , DONG Yuliang , ZHANG Hongwei , FANG Yuan.Experiment Study on Limit Assessment of GaAs MMIC Power Amplifier[J].Microelectronics,2012,42(4):596-600. | |
| Authors: | FU Wanyue DONG Yuliang ZHANG Hongwei FANG Yuan |
| Institution: | 1.School of Physical Electronics,University of Electronic Science and Technology of China,Chengdu 610054,P.R.China; 2.China Academy of Space Technology,Beijing 100029,P.R.China; 3.13th Research Institute,China Electronics Technology Group Corp.,Shijiazhuang 050051,P.R.China) |
| Abstract: | Limit assessment test technology was studied by means of the experiment on GaAs MMIC power amplifier.In the experiment,the detailed specification,key parameters,limit criterion and other data of this sample were analyzed,high temperature stepping and working voltage test profile were designed,and both the limit ability and failure modes of samples under thermal stress and electric stress were examined.Experimental result showed that different limits of test samples could be assessed to obtain the failure modes and the reliability margin effectively by using this technology,which provides the basis for improving the design,material and process of components. |
| Keywords: | Limit assessment GaAs MMIC Power amplifier Failure mode |
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