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Measurement and analysis of the height of potential barrier and depth of moving potential dot in the quantum point contact |
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| Affiliation: | 1. College of Geophysics, Chengdu University of Technology, Chengdu 610059, China;2. College of Physics, Sichuan University, Chengdu 610064, China |
| Abstract: | |
| Keywords: | Semiconductors Quantum dots Single electron devices |
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