Below-bandgap refractive index of AlAs/GaAs multiple quantum wells |
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Authors: | G. K. Hubler C. N. Waddell E. P. Donovan J. M. Zavada |
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Affiliation: | (1) Naval Research Laboratory, 20375 Washington, DC, USA;(2) Army Research Office, 27709 Raliegh, NC, USA |
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Abstract: | Precision reflection measurements were performed on GaAs/AlAs superlattices of the same composition but different layer spacings. Nonlinear-least-squares fits to the data were performed to a single layer. Measurements were extracted for the superlattice thickness, thickness of a disturbed interface layer between the superlattice and substrate, the uniformity in composition and/or spacing and the composition. It was demonstrated that these nondestructive measurements in the infrared region (3000 to 12 000 cm–1) in conjunction with a simple single layer model are capable of accurately yielding the above quantities with high precision. |
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