Small angle X-ray and dielectric data of soybean-phosphatidylcholine Phospholipon® 100 |
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Authors: | L. Börngen G. Nimtz M. Ghyczy J. Hager |
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Affiliation: | (1) Present address: II. Physikalisches Institut der Universität zu Köln, Köln, FRG;(2) Department R & D, Plant Protection A. Nattermann & Cie. GmbH, Köln, FRG |
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Abstract: | Soybean-Phosphatidylcholine Phospholipon® 100 has a stable gel conformation in the as-prepared state. We observed a main phase transition (chain melting) above 30 °C in the first heating run. This transition is marked 1. by a change of the lamellar repeat distance recorded by small angle X-ray diffraction, and 2. by an increase of the imaginary part of the dielectric constant. After the first heating up to + 90 °C the chains melt in a broad temperature range between –60 °C and +90 °C. The high stability of chain conformation in the temperature range –60 °C to +30 °C of the as-prepared state is due to the low water content of the material. |
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Keywords: | Soybean-phosphatidylcholine X-ray dielectric constant phase-transition chain-melting |
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