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红外焦平面探测器制冷组件可靠性研究进展
引用本文:赖灿雄,杨少华,路国光,恩云飞,黄云. 红外焦平面探测器制冷组件可靠性研究进展[J]. 光学与光电技术, 2013, 11(4): 29-32,59
作者姓名:赖灿雄  杨少华  路国光  恩云飞  黄云
作者单位:工业和信息化部电子第五研究所电子元器件可靠性物理及其应用技术重点实验室,广东广州,510610
摘    要:红外焦平面探测器制冷组件的可靠性研究对推进组件工程化应用具有重要意义。介绍了国外在组件的可靠性模型、失效模式、加速应力以及可靠性试验等方面的研究进展,并对国内的组件可靠性研究状况作了简要分析,总结了对组件可靠性研究的总体思路,为国内红外焦平面探测器制冷组件的可靠性研究提供参考。

关 键 词:红外焦平面  可靠性  失效模式  寿命试验

Research Progress on Reliability of Infrared Focal Plane Array Detector Cooler Assemblies
LAI Can-xiong,YANG Shao-hua,LU Guo-guang,EN Yun-fei,HUANG Yun. Research Progress on Reliability of Infrared Focal Plane Array Detector Cooler Assemblies[J]. optics&optoelectronic technology, 2013, 11(4): 29-32,59
Authors:LAI Can-xiong  YANG Shao-hua  LU Guo-guang  EN Yun-fei  HUANG Yun
Affiliation:Can-xiong YANG Shao-hua LU Guo-guang EN Yun-fei HUANG ( Laboratory of Science and Technology on Reliability Physics and Application of Electronic Component, The Fifth Research Institute of MIIT, Guangzhou 510610, China )
Abstract:Reliability research is of great significance for the engineering application of infrared focal plane array detector cooler assemblies. In this paper, research progress of reliability model, failure modes, acceleration factors, and reliability tests on the assemblies are introduced. In addition, the main thought of reliability research on the assemblies is briefly ana- lyzed. This provides a reference for the domestic reliability research of the assemblies.
Keywords:infrared focal plane array(IRFPA)  reliability  failure mode  life test
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