首页 | 本学科首页   官方微博 | 高级检索  
     


X‐ray absorption spectroscopy study of buried Co layers in the Co/Mo2C multilayer mirrors
Authors:Yanyan Yuan  Karine Le Guen  Jingtao Zhu  Zhanshan Wang  Wenbin Li  Mingwu Wen  Christian Mény  Haisheng Yu  Yuying Huang  Xiangjun Wei  Philippe Jonnard
Affiliation:1. Laboratoire de Chimie Physique‐Matière et Rayonnement, Sorbonne Universités, UPMC Univ Paris 06, Paris, France;2. Laboratoire de Chimie Physique‐Matière et Rayonnement, CNRS UMR 7614, Paris, FranceThe present address of author Yanyan Yuan is School of Materials Science and Engineering, Jiangsu University of Science and Technology, Mengxi Road 2, Zhenjiang, Jiangsu Province, 212003, China. The present address of author Yuchun Tu is Shanghai Institute of Laser Plasma, Chenjiashan Road 1129, Jiading district, Shanghai, 201800, China.;3. Laboratoire de Chimie Physique‐Matière et Rayonnement, CNRS UMR 7614, Paris, France;4. Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai, China;5. Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS‐Université De Strasbourg 23 rue du Loess, Strasbourg, France;6. Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied of Physics Chinese Academy of Sciences, Pudong, Shanghai, China
Abstract:X‐ray absorption spectroscopy at the Co K edge was applied to investigate the chemical environment of Co atoms inside Co/Mo2C periodic multilayers. The results show a mixing between Co and Mo2C layers prior to any annealing process, whereas following annealing from 300 °C pure Co layers are observed. X‐ray absorption spectroscopy results are in agreement with previous nuclear magnetic resonance spectroscopy results. They indicate that the pure Co content increases upon annealing, while it is absent in the as‐deposited samples. The comparison of the results, based on the analysis of the data obtained on the multilayer samples and some reference materials, reveals that the ordering of Co atoms inside the Co layers increases upon annealing. Copyright © 2016 John Wiley & Sons, Ltd.
Keywords:XANES  EXAFS  interface analysis  periodic multilayer  buried Co layers  annealing
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号