Morphological change of crystalline polymer films by annealing: substrate‐ and heating/cooling‐rate‐dependent surface roughness

We study the morphological change of crystalline polymer films by annealing using atomic force microscope, X‐ray diffraction, and Fourier transform infrared spectroscopy techniques. As typical samples, we employ high‐density and low‐density polyethylene films prepared by the cast method. After annealing at 135 °C for 4 h, the surface roughness of polyethylene films by the atomic force microscope significantly increases, and the crystallite size by the X‐ray diffraction also shows some increase, while the Fourier transform infrared spectroscopy spectrum hardly exhibits any change. This can be well explained as a result of the growth of crystal structure by recrystallization during annealing. More interestingly, we find that the choice of the substrate and also the heating/cooling rates for annealing significantly influences the surface roughness of the films. Copyright © 2017 John Wiley & Sons, Ltd.