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Dealing with inaccuracies in the analysis on solvent‐induced swelling of transparent thin films using in situ spectroscopic ellipsometry in the visible wavelength range |
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| Authors: | Kristianne Tempelman Emiel J. Kappert Michiel J.T. Raaijmakers Herbert Wormeester Nieck E. Benes |
| Affiliation: | 1. Films in Fluids, Department of Science and Technology, MESA+ Institute for Nanotechnology, University of Twente, Enschede, The Netherlands;2. Present address: BASF SE, Ludwigshafen, Germany;3. Physics of Interfaces and Nanomaterials, Department of Science and Technology, MESA+ Institute for Nanotechnology, University of Twente, Enschede, The Netherlands |
| Abstract: | |
| Keywords: | in situ spectroscopic ellipsometry measurement accuracy liquid ambient thin polymer film swelling |