Anomalous dispersion in nanocomposite films at the surface plasmon resonance

Nanocomposite thin films formed by Cu nanocrystals (NCs) embedded in an amorphous aluminium oxide (Al₂O₃) host have been prepared by alternate pulsed laser deposition. Spectroscopic ellipsometry is used to determine the effective refractive index (n=n+ik). The extinction coefficient is non-negligible and shows a broad absorption band related to the surface plasmon resonance. In the neighbourhood of this wavelength, the real part of the refractive index undergoes an anomalous dispersion, leading to a significant increase of the n value of the composite compared to that of the host. When the Cu content is low enough, about 2 at. %, the use of an effective medium approach combined with a regression method allows us to determine the metal content and film thickness from the ellipsometric measurements. For larger concentrations this approach is no longer valid. Received: 31 July 2001 / Revised version: 21 September 2001 / Published online: 15 October 2001