Modeling light trapping and electronic transport of waffle-shaped crystalline thin-film Si solar cells

Monocrystalline Si films from the novel perforated-Si process are candidates for the fabrication of thin-film solar cells because their waffle shape enhances the optical absorption and hence permits the use of films with a thickness of only a few microns. We study the optics of waffle cells by three-dimensional Monte Carlo ray-tracing. A high photogeneration of 38 mA/cm² from a film of thickness W_f=4 μm is possible due to a detached Al-back surface reflector that has an effective reflectance of 99.7% at 1250 nm. Our analytical model for light trapping in thin films explains this high reflectance. Two-dimensional numerical transport modeling reveals the existence of an optimum texture period p≈2W_f that originates from a carrier collection efficiency that increases with texture period while the photogeneration decreases with period. For well-passivated cells the optimum thickness W_f is at least one fifth of the diffusion length L. Efficiencies of 17% to 18% are feasible with waffle films of 1 to 3 μm in thickness. We introduce an analytic model for the minority carrier transport that agrees with two-dimensional numerical modeling to within 10% and reduces the computation time by orders of magnitude. This analytic model is also applicable to conformal thin-film geometries differing from the waffle geometry. Received: 1 March 1999 / Accepted: 28 March 1999 / Published online: 24 June 1999