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计算透射电镜薄样品中面状特征迹线转动角的新公式
引用本文:洪班德,孟庆昌. 计算透射电镜薄样品中面状特征迹线转动角的新公式[J]. 分析测试学报, 1991, 0(1)
作者姓名:洪班德  孟庆昌
作者单位:哈尔滨工业大学分析测试中心(洪班德),哈尔滨工业大学分析测试中心(孟庆昌)
摘    要:鉴于现有文献中关于面状特征迹线转动角的计算公式(简称pp公式)与实验测量结果相差较大,笔者模拟薄晶体样品位向调整时的双倾操作过程,推导出计算面状特征迹线方向随样品倾转而变化的新公式。通过与实验测量值及pp公式计算结果相比较,证实本公式给出的计算值与实验结果相符,并再次反映出pp公式的不适用性。

关 键 词:面状特征  迹线方向  迹线转动角  电子衍射花样及衍衬象

A New Equation to Estimate Trace Rotation Angle of Planar Features of TEM Foils
Hong Bande,Meng Qingchang Analysis and Measurement Centre,Harbin Institute of Technology,Harbin ,China. A New Equation to Estimate Trace Rotation Angle of Planar Features of TEM Foils[J]. Journal of Instrumental Analysis, 1991, 0(1)
Authors:Hong Bande  Meng Qingchang Analysis  Measurement Centre  Harbin Institute of Technology  Harbin   China
Affiliation:Hong Bande,Meng Qingchang Analysis and Measurement Centre,Harbin Institute of Technology,Harbin 150006,China
Abstract:Simulating the orientation adjustment operation of thin foils by double tilting, a new equa-tion to estimate trace direction of planar features in TEM thin foils has been derived to replacethe existent one(1) which has been pointed out by the authors of the present paper that it isnot applicable. The experimental observations and measurements on Alloy In718 specimen showthat the calculated trace direction by the new equation are consistent with the experimental verywell.
Keywords:Planar feature  trace direction  specimen stage  trace rotation angle  electron diffraction pattern and diffraction contrast image
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