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基于单晶硅材料的微摩擦测试机构及其试验研究
引用本文:郭占社,孟永钢,吴昊,苏才钧,温诗铸. 基于单晶硅材料的微摩擦测试机构及其试验研究[J]. 摩擦学学报, 2006, 26(3): 193-197
作者姓名:郭占社  孟永钢  吴昊  苏才钧  温诗铸
作者单位:清华大学,摩擦学国家重点实验室,北京,100084;清华大学,摩擦学国家重点实验室,北京,100084;清华大学,摩擦学国家重点实验室,北京,100084;清华大学,摩擦学国家重点实验室,北京,100084;清华大学,摩擦学国家重点实验室,北京,100084
基金项目:国家研究发展基金,国家杰出青年科学基金
摘    要:设计出1种能够模拟基于单晶硅材料微机电器件侧面摩擦副摩擦磨损状况的试验机,有效模拟可动MEMS器件摩擦副之间磨损的真实状况,介绍了试验机测试机构的工作原理并从理论计算及有限元模拟分析2方面对其结构模态进行分析,在超净间内(千级、室温、相对湿度RH约50%),利用光学显微镜、CCD图像采集系统及计算机对梳齿驱动器的谐振频率及摩擦副的动态摩擦系数进行了测试.结果表明:采用所研制的试验机测得的谐振频率为5 600,与理论计算及模拟分析的结果(5 590和5 641)非常接近;摩擦副的动态摩擦系数在0.24~0.35之间;动态摩擦系数随着施加在摩擦副上的正压力变化而变化.

关 键 词:单晶硅  模态分析  一阶谐振频率  动态摩擦系数
文章编号:1004-0595(2006)03-0193-05
收稿时间:2005-08-18
修稿时间:2005-11-15

A Single Crystal Silicon Based Micro-tribotester and Testing
GUO Zhan-she,MENG Yong-gang,WU Hao,SU Cai-jun,WEN Shi-zhu. A Single Crystal Silicon Based Micro-tribotester and Testing[J]. Tribology, 2006, 26(3): 193-197
Authors:GUO Zhan-she  MENG Yong-gang  WU Hao  SU Cai-jun  WEN Shi-zhu
Affiliation:State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China
Abstract:A single-crystal silicon based on-chip micro-tribotester is designed in order to simulate lateral friction and wear characters for moveable MEMS devices.Working principle is introduced in detail and mode analysis is carried out by means of theoretical calculation and finite element method in order to get resonant frequency of the system.Resonant frequency and dynamic friction coefficient were tested with optical microscopy,CCD image acquisition system and computer in clean booth(thousand class,room temperature and 50% atmospheric humidity).The tested natural frequency is 5600,which is close to the theoretical result 5590 and FEM result 5641.Dynamic frictional coefficient of the friction pair is in the range of 0.24 and 0.35.It is verified that with the variation of normal force,dynamic friction coefficient is no longer a constant value.
Keywords:single-crystal   mode analysis   one class resonant frequency   dynamic friction coefficient
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