Atomic resolution of defects in graphite studied by STM |
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| Authors: | F Atamny A Baiker R Schlögl |
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| Institution: | (1) Department of Chemical Engineering and Industrial Chemistry, Swiss Federal Institute of Technology, ETH-Zentrum, CH-8092 Zürich, Switzerland, CH;(2) Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4–6, D-14195 Berlin, Germany, DE |
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| Abstract: | Different kinds of defects in graphite with a resolution up to atomic scale have been investigated using STM. Mono-atomic
steps on the surface as well as bended graphite layers with height differences less than 0.1 nm originating from defects (steps)
in the bulk have been uncovered. The influence of such defects on the appearance of superstructures in the surrounding area
is demonstrated. Ribbons, with a few nanometers width and less than 1 nm height, and prismatic loops were resolved. Height
variations in the range of a few tenths of nanometer as a result of missed and inserted carbon layers have been revealed.
To our knowledge, for the first time defect lines on graphite are presented with an atomic resolution. The defect lines are
several microns long and only 1–3 atoms in width.
Received: 24 June 1996 / Revised: 24 January 1997 / Accepted: 29 January 1997 |
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