PIE: Perpendicular-incidence ellipsometry—application to the determination of the optical properties of uniaxial and biaxial absorbing crystals |
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| Authors: | R.M.A. Azzam |
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| Affiliation: | Hematology Division and Department of Internal Medicine, College of Medicine, University of Nebraska Medical Center, Omaha, Nebraska 68105, USA;Electrical Materials Laboratory, Engineering Research Center, College of Engineering, University of Nebraska, Lincoln, Nebraska 68588, USA |
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| Abstract: | Perpendicular-incidence ellipsometry (to be given the acronym PIE) is simpler than oblique-incidence conventional or generalized ellipsometry as a tool for the characterization of optically anisotropic surfaces. To illustrate the potential usefulness and simplicity of PIE, we present an example of its application to the determination of the optical properties of uniaxially and biaxially anisotropic crystals. |
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