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Automated Mueller matrix ellipsometry |
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| Authors: | P.S. Hauge |
| Affiliation: | IBM Thomas J. Watson Research Center Yorktown Heights, N.Y. 10598, USA |
| Abstract: | The application of rotating-compensator ellipsometry (RCE) to measurements of the system Mueller matrix M of linear optical systems is reported. This technique extends a previously reported procedure for automated Jones matrix ellipsometry to include systems that depolarize light. |
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