Multilayer interference mirrors for the XUV range around 100 eV photon energy |
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Authors: | R.-P. Haelbich C. Kunz |
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Affiliation: | II. Institut fu¨r Experimentalphysik, Universita¨t Hamburg, 200 Hamburg 50, Luruper Chaussee 149, Fed. Rep. Germany;Deutsches Elektronen-Synchrotron DESY, 2000 Hamburg 52, Notkestieg 1, Fed. Rep. Germany |
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Abstract: | For the first time successful results have been obtained demonstrating interference effects in the reflectance of multilayer films at high photon energies where n = 1 and k is large. Films with 3.5 to 4.5 periods of Au/C and Cu/C were investigated for angles of incidence α = 15° to α = 60° in the wavelength interval 80 to 300A?. The highest near-normal incidence reflectance found was R = 2.7% for Au/C and R = 1.2% for Cu/C at λ ~ 190A?and α = 15°. These values were by a factor of 7 higher than those for a single layered opaque Au film (respectively a factor of 6 for Cu) evaporated under the same conditions. Further improvements appear to be possible. Calculations were performed to guide the investigations and to help the interpretation of the results. |
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