Novel optical film sensor design based on p-polarized reflectance |
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Authors: | Zhengtian Gu Peihui Liang |
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Affiliation: | a College of Science, University of Shanghai for Science and Technology, P.O. Box 249, 516 Jun Gong Road, Shanghai 200093, PR China;b Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, P.O. Box 800-211, Shanghai 201800, PR China |
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Abstract: | A new scheme of optical film sensor is presented. The sensor is based on p-polarized reflectance, consisting of a sensing coated substrate, is easily optimized for maximum sensitivity in different applications. The resolutions of refractive index nf, extinction coefficient kf and thickness hf of the sensitive films are predicted to be 10−7, 10−5 and 10−3 nm, respectively. Experimentally, we selected the sol–gel derived SnO2 films as gas-sensitive films and conducted preliminary gas-sensing test. The results indicate that novel optical film sensor scheme has higher sensitivity, and the detection sensitivity is available to 10−1 ppm on the condition of optimum optical parameters and incident angle. |
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Keywords: | Author Keywords: Optical film sensor p-Polarized reflectance Optical parameter |
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