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Optical characterization of the silicon photodiodes for the establishment of national radiometric standards
Authors:Murat Durak   M. Hasan Aslan
Affiliation:a National Metrology Institute of Turkey, TÜB"Image"TAK-UME, Gebze, Turkey;b Department of Physics, Gebze Institute of Technology, Gebze, Turkey
Abstract:Optical properties of the silicon photodiodes are investigated in the visible spectral regime. Non-linearity measurement standard was established by using Hamamatsu S1337-11 type windowless silicon photodiode whose non-linearity value was found to be better than 6×10−5 at photocurrent level of 10−9 to 10−4 A. Temperature effects on the spectral responsivity for S1337-11, S1337-1010BQ and S1227-1010BQ type photodiodes were analyzed between 20°C and 40°C at 488.1, 514.7 and 632.8 nm vacuum wavelengths. The spatial uniformities of the responsivity for three type photodiodes are performed with a laser beam having 1 mm diameter by using home made two-axis micro translation system. Results of the reflectance measurements for three elements of reflection-based trap detectors were compared with the predicted values obtained from Fresnel equations.
Keywords:Author Keywords: Silicon photodiodes   Spectral responsivity   Spatial uniformity   Trap detectors
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