首页 | 本学科首页   官方微博 | 高级检索  
     

精确测量石英晶体旋光率的光谱分析法
引用本文:马丽丽,吴福全,郝殿中,苏富芳,史萌. 精确测量石英晶体旋光率的光谱分析法[J]. 光谱学与光谱分析, 2012, 32(10): 2615-2619. DOI: 10.3964/j.issn.1000-0593(2012)10-2615-05
作者姓名:马丽丽  吴福全  郝殿中  苏富芳  史萌
作者单位:曲阜师范大学激光研究所,山东省激光偏光与信息技术重点实验室,山东 曲阜 273165
基金项目:国家青年科学基金项目,山东省优秀中青年科学家奖励基金
摘    要:提出一种精确测量石英晶体旋光率的光谱分析法。利用光学矩阵方法对测量原理进行了分析,指出通过测量由两个平行放置的偏光镜和石英晶体所组成系统的透射曲线就可以精确计算出石英晶体的旋光率;并利用分光光度计设计实验,验证了该方法的正确性。对实验数据进行了处理,拟合出了旋光色散方程,对比Lowry的公式,所得出的公式在可见光范围内的更为精准。对实验数据进行了误差分析, 结果表明:选取厚的石英晶体,长的测量波段、低的扫描速度、小的狭缝宽度都有利于提高测量精度。

关 键 词:光谱学  光谱分析法  旋光色散方程  旋光晶体  旋光率  厚度误差  
收稿时间:2012-04-11

Spectral Analysis Method for Precisely Measuring Specific Rotation of Quartz
MA Li-li , WU Fu-quan , HAO Dian-zhong , SU Fu-fang , SHI Meng. Spectral Analysis Method for Precisely Measuring Specific Rotation of Quartz[J]. Spectroscopy and Spectral Analysis, 2012, 32(10): 2615-2619. DOI: 10.3964/j.issn.1000-0593(2012)10-2615-05
Authors:MA Li-li    WU Fu-quan    HAO Dian-zhong    SU Fu-fang    SHI Meng
Affiliation:Shandong Provincial Key Laboratory of Laser Polarization and Information Technology, Laser Institute, Qufu Normal University, Qufu 273165, China
Abstract:A spectral analysis method for precisely measuring specific rotation of quartz is proposed. The measuring principle is analyzed by using the method of optical matrix. The result indicates that the specific rotation of quartz can be exactly calculated by measuring the transmittance curve of a sample quartz plate sandwiched between two paralleled polarizing prisms, and the correctness of the method is validated by a designed experiment using a spectrophotometer. The data is analyzed, and the rotary dispersion formula of quartz is fitted. Compared with Lowry’ formula, our formula is more accurate in visible spectral scope. Errors in the experiment is analyzed and the result shows that the measuring accuracy will be improved by choosing thicker quartz plate, longer wave band, lower scan speed, and smaller slit width.
Keywords:Spectroscopy  Spectral analysis method  Rotary dispersion formula  Rotary crystal  Specific rotation  Thickness errors   
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《光谱学与光谱分析》浏览原始摘要信息
点击此处可从《光谱学与光谱分析》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号