Interface microstructure in epitaxial YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox ramp-type Josephson junctions

The interfaces in ramp-type YBa₂Cu₃O_x/PrBa₂Cu₃O_x/YBa₂Cu₃O_x Josephson junctions with different ramp slopes were characterized electrically and structurally. From the cross-sectional TEM images, it has been found that the epitaxy remains through all layers even on the ramp surface, providing the ramp angle is less than 45°. No big defects such as grain boundaries and secondary phases occurred at the interface. The major defects which appeared at the interface are antiphase boundaries which were formed by lattice shifts with c/3 unit between PrBa₂Cu₃O_x and YBa₂Cu₃O_x. The interface between YBa₂Cu₃O_x base-layer and PrBa₂Cu₃O_x barrier is more defective in comparison with that between PrBa₂Cu₃O_x barrier and top-layer. Alteration of the ramp slope from 10° to 45° leads to a significant increase in the density of defects near the base-YBa₂Cu₃O_x/PrBa₂Cu₃O_x interface. The average roughness of the ramp surface created by ion milling is about 10 nm, which seems insensitive to the ramp slope. The damaged ramp surface could be repaired during the subsequent deposition process, leading to a negligible interface resistance.