Measurement of Carrier-Envelope Phase and Field Strength of a Few-Cycle Pulse by Non-sequential Double Ionization |
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| Authors: | LI Hong-Yun CHEN Jing JIANG Hong-Bing LIU Jie FU Pan-Ming GONG Qi-Huang YAN Zong-Chao WANG Bing-Bing |
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| Affiliation: | [1]Laboratory of Optical Physics, Belting National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080 [2]Department of Physics, State Key Laboratory for Artificial Microstructures and Mesoscopic Physics, Peking University, Beijing 100871 [3]Center for Nonlinear Studies, Institute of Applied Physics and Computational Mathematics, Beijing 100088 [4]Department of Physics, University of New Brunswick, PO Box 4400, Fredericton, New Brunswick, E3B 5A3, Canada [5]Center for Theoretical Atomic and Molecular Physics, the Academy of Fundamental and Interdisciplinary Sciences, Harbin Institute of Technology, Harbin 150080 [6]Center for Applied Physics and Technology, Petting University, Beijing 100876 |
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| Abstract: | We propose a method to measure the carrier-envelop phase (CEP) and the intensity of a few-cycle pulse by controlling the non-sequential double ionization (NSDI) process. By using an additional static electric field, we can change the momentum distribution of the double-charged ions parallel to the laser polarization from an asymmetrical double-hump structure to a nearly symmetrical one. It is found that the ratio between the strength of the static electric field and that of the laser field is sensitive to the CEP but robust against the intensity fluctuation. Therefore we can determine the CEP of a few-cycle pulse precisely by measuring the static electric field. Furthermore, if the CEP of the few-cycle pulse is fixed at a certain value, we can also calibrate the intensity of the laser pulse by the static electric field. |
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| Keywords: | 42.65.-k 42.50.Hz 32.80.Rm |
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