Electrical conduction in sputtered Si:Al films |
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| Authors: | AD Inglis JR Dutcher N Savvides SP McAlister CM Hurd |
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| Institution: | Solid State Chemistry, National Research Council of Canada, Ottawa, Ontario K1A OR9, Canada |
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| Abstract: | The d.c. electrical resistivity ?(x, T) has been measured for a series of granular SixAl1?x sputtered films for 0.25 < x < 0.62 and 4K < T < 300 K. Three separate behaviours are identified in ?(x, T) corresponding to extrinsic activated semiconduction, metallic conduction and electron localisation. |
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