The dependence of inelastic electron tunneling on junction roughness |
| |
| Authors: | P.R. Varker J.R. Kirtley J.C. Tsang |
| |
| Affiliation: | I.B.M. Thomas J. Watson Research Center Yorktown Heights, New York 10598, USA |
| |
| Abstract: | We have made a series of Al-Al2O3-benzoic acid-Pb inelastic electron tunneling spectroscopy (IETS) junctions on substrates roughened by varying thicknesses of CaF2. The vibrational peaks due to the molecular monolayer of benzoic acid disappear as the substrates are made rougher. We speculate on the cause of this disappearance. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
