Using Carrier Fringes to Study the High Temperature Deformation Behavior of a BGA Package Under Extended Dwell Times

There is a compelling need to experimentally understand solder joint deformation behavior at high temperatures over an extended period of time. Accordingly, the deformation behavior of solder joints in a Ceramic Ball Grid Array (CBGA) package mounted on an organic FR4 board under extended dwell time at a high temperature has been studied using laser moiré interferometry. The warpage and the in-plane horizontal deformation of the ceramic substrate and the organic board as a function of time were determined. The variation of the normal strains and shear strains in the solder joints with time were also investigated. It was found that increased sensitivity was necessary to accurately determine the strains in the small sized solder joints. A new method utilizing carrier fringes to increase the sensitivity of the moiré interferometry system is proposed and has been used to determine the strains in the small sized solder joints. Increased sensitivity can be obtained merely by changing the incident angle of the laser light on the surface of the specimen, thereby making it unnecessary to use expensive phase shifting apparatus with the traditional laser moiré system.