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Latent track creation in fused silica by 200 MeV silver beam |
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| Authors: | T. Mohanty P. V. Satyam N. C. Mishra D. Kanjilal |
| Affiliation: | a Nuclear Science Centre, Aruna Asaf Ali Marg, New Delhi-110 067, India b Institute of Physics, Bhubaneswar-751 005, India c Physics Department, Utkal University, Bhubaneswar-751 004, India |
| Abstract: | Studies of formation of latent tracks in swift heavy ion irradiated SiO2 are presented. Fused silica (SiO2) were irradiated with 200 MeV silver (Ag) ion beam at varying fluences. Radiation-induced effects were studied by ultraviolet(UV)/Visible optical absorption spectroscopy and transmission electron microscopy (TEM). UV/Visible absorption study indicated E′ centers and oxygen deficiency centers having characteristic absorption occurred at 5 eV. The density of these color centers calculated from the absorption peak intensity showed Poisson-type variation with irradiation fluence. The defects are thus entirely confined to the latent tracks created by swift heavy ions in SiO2. The track radius estimated from optical absorption study was found to be 5.1 nm. Similar results were obtained from TEM studies of the irradiated samples. |
| Keywords: | Fused silica Latent track Defects Optical absorption TEM |
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