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电子元器件失效模式影响分析技术
引用本文:黄云,恩云飞.电子元器件失效模式影响分析技术[J].电子元件与材料,2007,26(4):65-67.
作者姓名:黄云  恩云飞
作者单位:信息产业部电子第五研究所,电子元器件可靠性物理及其应用技术国家级重点实验室,广东,广州,510610
摘    要:在元器件中进行失效模式影响分析(FMEA)技术研究和应用的基础上,论述了适合元器件的失效模式、机理影响分析(FMMEA)技术,在国内首次将FMMEA技术应用到元器件的基础上,研制了FMMEA技术分析软件,为元器件的研制和使用中控制或消除相关的失效模式及机理,提高产品质量和可靠性提供了一个新的方法和思路。

关 键 词:电子技术  元器件  可靠性  失效模式及机理影响分析
文章编号:1001-2028(2007)04-0065-03
修稿时间:2006-11-28

Failure modes effects analysis of electronic components
HUANG Yun,EN Yun-fei.Failure modes effects analysis of electronic components[J].Electronic Components & Materials,2007,26(4):65-67.
Authors:HUANG Yun  EN Yun-fei
Institution:The No.5 Research Institute of MII, Natiohal Key Laboratory for Reliability Physics and Application Technology of Electronic Product, Guangzhou 510610, China
Abstract:Based on the research and application of failure modes and mechanisms effects analysis (FMMEA), the FMMEA techniques which suitable for electronic components was discussed. And it is first time in domestic to apply FMMEA techniques to electronic components. A FMMEA analysis software for electronic components is developed, which can be used for control and elimination the related failure modes and mechanisms during the development and using stages. It also provides a new technique and way to improve the quality and reliability of electronic components.
Keywords:electron technology  electronic components  reliability  failure modes and mechanism effects analysis
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