| K故障下确定最优可测试成分的新方法 |
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| 引用本文： | 李义府.K故障下确定最优可测试成分的新方法[J].数学理论与应用,2001,21(2):116-120. |
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| 作者姓名： | 李义府 |
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| 作者单位： | 中南大学信息科学与工程学院，长沙410083 |
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| 摘 要： | 本提出了在模拟线性电路故障诊断中K故障假设下一组最优可测试成份确定的方法，它是基于电路的可测试值计算规范式不确定性组的确定，所提出的步骤与故障定位方法无关。
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| 关 键 词： | 可测试性 不确定性组 故障诊断 线性模拟电路 K故障 网络函数 |
A NEW METHOD FOR DETERMINING AN OPTIMUM SET OF TESTABLE COMPONENTS UNDER K-Faults hypothesis |
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| Li yifu.A NEW METHOD FOR DETERMINING AN OPTIMUM SET OF TESTABLE COMPONENTS UNDER K-Faults hypothesis[J].Mathematical Theory and Applications,2001,21(2):116-120. |
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| Authors: | Li yifu |
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| Abstract: | A method of determining an optimum set of testable components in the fault diagnosis of analog linear circuits under K faults hypothesis is presented in the paper.It is beaed on the testability evaluation of the circuit and on the determination of the canonical ambiguity group.The proposed procedure is independent on the method of fault location. |
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| Keywords: | testability ambiguity groups fault diagnosis |
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