High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification |
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Authors: | Bo Yao Tik Sun Andrew Warren Helge Heinrich Katayun Barmak Kevin R. Coffey |
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Affiliation: | 1. Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249, USA;2. Instituto de Física, UNAM, Circuito de la Investigación s/n, Col. Ciudad Universitaria, Coyoacán, México D. F. 04510, Mexico;3. Univ. Grenoble Alpes, SIMAP, F-38000 Grenoble, France;4. CNRS, SIMAP, F-38000 Grenoble, France |
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Abstract: | In this paper, we describe hollow-cone dark field (HCDF) transmission electron microscopy (TEM) imaging, with a slightly convergent beam, as an improved technique that is suitable to form high contrast micrographs for nanocrystalline grain size quantification. We also examine the various factors that influence the HCDF TEM image quality, including the conditions of microscopy (alignment, focus and objective aperture size), the properties of the materials imaged (e.g., atomic number, strain, defects), and the characteristics of the TEM sample itself (e.g., thickness, ion milling artifacts). Sample preparation was found to be critical and an initial thinning by wet etching of the substrate (for thin film samples) or tripod polishing (for bulk samples), followed by low-angle ion milling was found to be the preferred approach for preparing high-quality electron transparent samples for HCDF imaging. |
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