Method for measuring integrated sensitivity of solar cells and multielement photoconverters using an X-Y scanner

We describe a method for automated measurement of the integrated sensitivity of solar cells (SCs) and multielement photoconverters (MPCs) using an experimental apparatus including a Pentium III personal computer (PC), an HP-34401A digital multimeter (DM), a stabilized radiation source (SRS), a controllable focusing system, an X-Y positioning device based on CD-RW optical disk storage devices. The method provides high accuracy in measuring the size of photosensitive areas of the solar cells and multielement photoconverters and inhomogeneities in their active regions, which makes it possible to correct the production process in the development stage and during fabrication of test prototypes for the solar cells and multielement photoconverters. The radiation power from the stabilized radiation source was ≤1 W; the ranges of the scanning steps along the X, Y coordinates were 10–100 μm, the range of the transverse cross sectional diameters of the focused radiation beam was 10–100 μm, the measurable photocurrents were 10⁻⁹ A to 2 A; scanning rate along the X, Y coordinates, ≤100 mm/sec; relative mean-square error (RMSE) for measurement of the integrated sensitivity of the solar cells, 0.2 ≤ γS _int ≤ 0.9% in the ranges of measurable photocurrents 1 mA ≤ I_ph ≤ 750 mA and areas 0.1 ≤ A ≤ 25 cm² for number of measurements equal to ≤ 2· 10⁵; instability of the radiation power (luminosity) ≤ 0.08% for 1 h or ≤ 0.4% for 8 h continuous operation; stabilized power range for the stabilized radiation source, 10⁻²–10² W. The software was written in Delphi 7.0. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 73, No. 5, pp. 670–675, September–October, 2006.