| Measurement of the wavelength modulation indices with selective reflection spectroscopy |
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| 引用本文： | 肖连团,赵建明,尹王保,赵延霆,Bernard Journet,贾锁堂. Measurement of the wavelength modulation indices with selective reflection spectroscopy[J]. 中国光学快报(英文版), 2003, 1(7) |
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| 作者姓名： | 肖连团 赵建明 尹王保 赵延霆 Bernard Journet 贾锁堂 |
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| 作者单位： | State Key Lab of Quantum Optics and Quantum Devices，Department of Electronics & Information Technology，Shanxi University，Taiyuan 030006 SATIE Lab，Ecole Normale Superieure de Cachan，61 Avenue du President Wilson 94230 Cachan，France，State Key Lab of Quantum Optics and Quantum Devices，Department of Electronics & Information Technology，Shanxi University，Taiyuan 030006，State Key Lab of Quantum Optics and Quantum Devices，Department of Electronics & Information Technology，Shanxi University，Taiyuan 030006，State Key Lab of Quantum Optics and Quantum Devices，Department of Electronics & Information Technology，Shanxi University，Taiyuan 030006，SATJE Lab，EcoJe Normale Superieure de Cachan，61 Avenue du President Wilson 94230 Cachan，France，State Key Lab of Quantum Optics and Quantum Devices，Department of Electronics & Information Technology，Shanxi University，Taiyuan 030006 |
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| 基金项目： | This work was supported in part by the National Natural Science Foundation of China (Grant No. 10174047, 60078009)，Natural Science Foundation of Shanxi Province. |
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| 摘 要： | The wavelength modulation indices are measured based on harmonic amplitude ratio of 4famp/6famp (4famp and 6famp are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective reflection modulation spectroscopy. The experiments for the 6S1/2(F = 4) → 6P3/2(F' = 5) transition of cesium D2 line with 30-MHz linewidth were carried out. The 4f- and 6f-harmonic signals were detected with two digital lock-in amplifiers separately. The maximum error for modulation indices measurement was ±0.1 within the range of m from 3 to 6. The non-linear modulation behaviour of an external cavity diode laser induced by voltage tuning was studied with this method. The method for modulation indices measurement does not require a solid etalon as usual for measuring the wavelength modulation depth and the absorption linewidth correspondingly.
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Measurement of the wavelength modulation indices with selective reflection spectroscopy |
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| Bernard Journet. Measurement of the wavelength modulation indices with selective reflection spectroscopy[J]. Chinese Optics Letters, 2003, 1(7) |
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| Authors: | Bernard Journet |
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| Abstract: | The wavelength modulation indices are measured based on harmonic amplitude ratio of 4famp/6famp (4fampand 6famp are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-freeselective reflection modulation spectroscopy. The experiments for the 6S1/2(F = 4) → 6P3/2(F′ = 5)transition of cesium D2 line with 30-MHz linewidth were carried out. The 4f- and 6f-harmonic signalswere detected with two digital lock-in amplifiers separately. The maximum error for modulation indicesmeasurement was ±0.1 within the range of m from 3 to 6. The non-linear modulation behaviour of anexternal cavity diode laser induced by voltage tuning was studied with this method. The method formodulation indices measurement does not require a solid etalon as usual for measuring the wavelengthmodulation depth and the absorption linewidth correspondingly. |
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