Secondary scintillation yield from GEM and THGEM gaseous electron multipliers for direct dark matter search |
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Authors: | C.M.B. Monteiro L.M.P. Fernandes J.F.C.A. Veloso C.A.B. Oliveira J.M.F. dos Santos |
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Affiliation: | 1. CI, Physics Department, University of Coimbra, 3004-516 Coimbra, Portugal;2. I3N, Physics Department, University of Aveiro, 3810-193 Aveiro, Portugal |
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Abstract: | The search for alternatives to PMTs as photosensors in optical TPCs for rare event detection has significantly increased in the last few years. In particular, in view of the next generation large volume detectors, the use of photosensors with lower natural radioactivity, such as large area APDs or GM-APDs, with the additional possibility of sparse surface coverage, triggered the intense study of secondary scintillation production in micropattern electron multipliers, such as GEMs and THGEMs, as alternatives to the commonly used uniform electric field region between two parallel meshes. The much higher scintillation output obtained from the electron avalanches in such microstructures presents an advantage in those situations. The accurate knowledge of the amount of such scintillation is important for correct detector simulation and optimization. It will also serve as a benchmark for software tools developed and/or under development for the calculation of the amount of such scintillation. |
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Keywords: | Xenon scintillation Argon scintillation Dual-phase detectors Dark matter GEM THGEM Avalanche photodiodes |
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