| 用阴极发光显微术研究YAG:Nd~(3+)晶体中的缺陷 |
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| 引用本文： | 黄德群,王浩炳,邓佩珍. 用阴极发光显微术研究YAG:Nd~(3+)晶体中的缺陷[J]. 光学学报, 1987, 0(10) |
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| 作者姓名： | 黄德群 王浩炳 邓佩珍 |
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| 作者单位： | 中国科学院上海光学精密机械研究所(黄德群，王浩炳)，中国科学院上海光学精密机械研究所(邓佩珍) |
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| 摘 要： | 采用扫描电子显微镜中的阴极发光显微术获得了YAG:Nd~(3+)激光晶体中不同缺陷所形成的显微发光图象。据此进一步分析了这些缺陷的形成机制及其对材料性能的影响。
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| 关 键 词： | 阴极发光显微术 晶体缺陷 YAG:Nd~(3+)晶体 扫描电子显微术 |
Study of defects in YAG: Nd~(3+) crystals by means of cathodoluminescence micrography |
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| HUANG DEQUN,WANG HAOBING AND DENG PEIZHEN. Study of defects in YAG: Nd~(3+) crystals by means of cathodoluminescence micrography[J]. Acta Optica Sinica, 1987, 0(10) |
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| Authors: | HUANG DEQUN WANG HAOBING AND DENG PEIZHEN |
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| Abstract: | Using the cathodoluminescence (CL) mode of operation of the scanning electron microscope (SEM), OL images of various defects in YAG:Nd3+ crystals have been obtained. Prther investigation of the formation mechanism of the defects and effects of performances in YAG:Nd3+ crystals has been made according to the OL images. |
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| Keywords: | cathodoluminescence microscopy defect in crystal YAG:Nd~(3+) crystal scanning electron microscopy. |
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