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A moving interface crack between two dissimilar functionally graded piezoelectric layers under electromechanical loading
Authors:Jeong Woo Shin  Young-Shin Lee
Institution:1. Korea Aerospace Research Institute, 45 Eoeun-Dong, YouSeong, Daejeon 305-333, Republic of Korea;2. Department of Mechanical Design Engineering, Chungnam National University, 220 Gung-Dong, YouSeong, Daejeon 305-764, Republic of Korea
Abstract:The dynamic propagation of an interface crack between two dissimilar functionally graded piezoelectric material (FGPM) layers under anti-plane shear is analyzed using the integral transform method. The properties of the FGPM layers vary continuously along the thickness. The properties of the FGPM layers vary differently and the two layers are connected weak-discontinuously. A constant velocity Yoffe-type moving crack is considered. Fourier transform is used to reduce the problem to two sets of dual integral equations, which are then expressed to the Fredholm integral equations of the second kind. Numerical values on the dynamic energy release rate (DERR) are presented for the FGPM to show the effects on the electric loading, gradient of material properties, crack moving velocity, and thickness of layers. Followings are helpful to increase of the resistance of the interface crack propagation of FGPM: (a) certain direction and magnitude of the electric loading; (b) increase of the gradient of material properties; (c) increase of the material properties from the interface to the upper and lower free surface; (d) increase of the thickness of FGPM layer. The DERR increases or decreases with increase of the crack moving velocity.
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