| 喇曼-原子力显微镜的研究进展 |
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| 引用本文： | 何家玉,邓惠勇,王奇伟,戴宁,Da Ming-Zhu.喇曼-原子力显微镜的研究进展[J].红外,2009,30(5):19-22. |
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| 作者姓名： | 何家玉 邓惠勇 王奇伟 戴宁 Da Ming-Zhu |
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| 作者单位： | 1. 中国科学院上海技术物理研究所,上海,200083
2. Department of Physics,University of Missouri-Kansas City,Missouri,USA 64110 |
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| 摘 要： | 喇曼-原子力显微镜(Raman-AFM)是一种基于探针增强喇曼散射效应(TERS)的新型形貌表征与光电测试设备,能够在纳米尺度上对低维结构材料与器件进行喇曼研究.本文详细介绍了Raman-AFM的基本原理与关键技术特点,并展望了它的发展前景.
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| 关 键 词： | 喇曼-原子力显微镜 探针增强喇曼散射效应 低维结构 |
| 收稿时间： | 2008/12/19 |
Research Progress in Raman-Atomic Force Microscopy |
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| HE Jia-yu,DEN Hui-yong,WANG Qi-wei,DAI Ning,Da Ming-Zhu.Research Progress in Raman-Atomic Force Microscopy[J].Infrared,2009,30(5):19-22. |
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| Authors: | HE Jia-yu DEN Hui-yong WANG Qi-wei DAI Ning Da Ming-Zhu |
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| Institution: | 1.Shanghai Institute of Technical Physics;Chinese Academy of Sciences;Shanghai 200083;China 2.Department of Physics;University of Missouri-Kansas City;Missouri;USA 64110 |
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| Abstract: | Raman-atomic force microscopy(Raman-AFM) is a new morphology characterization and optoelectronic measurement instrument based on the Tip-enhanced Raman Scattering Effect(TERS). It can be used to perform Raman investigation on the low-dimensional structure materials and devices to the nano scale.In this paper,the fundamental principle and key techniques of the Raman-AFM are presented in detail and the prospects of the Raman-AFM are given. |
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| Keywords: | Raman-AFM TERS low-dimensional structure |
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