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The influences of gas and electron temperatures on electron attachment in gas electrical discharges
Authors:Patrik Španěl  David Smith
Institution:(1) J. Heyrovsky Institute of Physical Chemistry, Acad. Sci. CR, Dolejškova 3, 18223 Praha 8, Czech Republic;(2) Centre for Science and Technology in Medicine, School of Postgraduate Medicine, Keele University, Thornburrow Drive, Hartshill, Stoke-on-Trent, UK
Abstract:Various electron attachment processes are reviewed, emphasising the way in which the rates and products of some selected reactions vary with the attaching gas temperatureT g, the temperature,T e, and the energy of the attaching electrons. The examples illustrating the variety of reactions are the efficient dissociative attachment reaction to CCl4, attachment to SF6 which involves both dissociative and non-dissociative attachment, attachment to CHCl3 which requires activation energy, and attachment to CCl3Br which results in both Cl- and Br- product ions. A model has been presented which is able to quantitatively explain the difference influences ofT g andT e on the rates of some of these reactions. Also described are the unusually efficient attachment properties of the fullerene molecules C60 and C70 as revealed by our FALP experiments, noting that these molecules have potential importance as efficient suppressers of electrical breakdown through gases such as those used to insulate high voltage devices. We emphasise throughout this paper the importance of an understanding of the separate influences of gas and electron temperature on attachment reactions for the modelling of practical gas discharge media such as etchant plasmas. We dedicate this paper to Professor Jan Janča on the occasion of his sixtieth birthday in recognition of his major contributions to gas discharge physics.
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