Material profile influences in bulk‐heterojunctions |
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| Authors: | John D. Roehling Christopher W. Rochester Hyun Wook Ro Peng Wang Jaroslaw Majewski K. Joost Batenburg Ilke Arslan Dean M. Delongchamp Adam J. Moulé |
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| Affiliation: | 1. Department of Chemical Engineering and Materials Science, University of California, , Davis, California;2. Materials Science and Engineering Laboratory, National Institute of Standards and Technology (NIST), , Gaithersburg, Maryland;3. Lujan Neutron Scattering Center, Los Alamos National Laboratory (LANL), , Los Alamos, New Mexico;4. Scientific Computing, Centrum Wiskunde and Informatica, , Amsterdam, Netherlands;5. iMinds‐Vision Lab, University of Antwerp, , Antwerp, Belgium;6. Fundamental and Computational Sciences, Pacific Northwest National Laboratory (PNNL), , Richland, Washington |
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| Abstract: | The morphology in mixed bulk‐heterojunction films are compared using three different quantitative measurement techniques. We compare the vertical composition changes using high‐angle annular dark‐field scanning transmission electron microscopy with electron tomography and neutron and x‐ray reflectometry. The three measurement techniques yield qualitatively comparable vertical concentration measurements. The presence of a metal cathode during thermal annealing is observed to alter the fullerene concentration throughout the thickness of the film for all measurements. However, the absolute vertical concentration of fullerene is quantitatively different for the three measurements. The origin of the quantitative measurement differences is discussed. © 2014 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2014 , 52, 1291–1300 |
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| Keywords: | blends bulk‐heterojunction electron microscopy miscibility morphology structure vertical‐segregation |
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