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Spectrometric and ellipsometric studies of (1 − x)TiO2 · xLn2O3 (Ln = Nd, Sm, Gd, Er, Yb) thin films |
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| Authors: | M Kranjcec IP Studenyak |
| Institution: | a University of Zagreb, Geotechnical Department Vara?din, 7 Hallerova Aleja, 42000 Vara?din, Croatia b Ruder Boškovic Institute, 54 Bijeni?ka Cesta, 10000 Zagreb, Croatia c Uzhhorod National University, 46 Pidhirna St., Uzhhorod 88000, Ukraine |
| Abstract: | Spectrometric and ellipsometric studies of (1 − x)TiO2 · xLn2O3 (Ln = Nd, Sm, Gd, Er, Yb; x = 0.33, 0.5) thin films at room temperature were performed. The obtained dispersion dependences of refractive indices are successfully described by the optical-refractometric relation. The dependence of optical pseudogap and refractive indices on composition and molar mass of the films is investigated. The influence of compositional disordering on the energy width of the exponential absorption edge is studied. |
| Keywords: | 42 79 Wc 71 55 Jv 78 20 &minus e 78 20 Ci |
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