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SPEES针尖参数对样品表面电子出射影响的模拟研究
引用本文:李继伟,徐春凯,刘文杰,方可,陈向军,徐克尊.SPEES针尖参数对样品表面电子出射影响的模拟研究[J].原子核物理评论,2009,26(2):140-145.
作者姓名:李继伟  徐春凯  刘文杰  方可  陈向军  徐克尊
作者单位:合肥微尺度物质科学国家实验室, 中国科学技术大学近代物理系, 安徽 合肥 230026
基金项目:国家自然科学基金资助项目(10404026);;国家基础科学人才培养基金资助项目(J0630319)~~
摘    要:报道了对扫描探针电子能谱仪(SPEES)中俄歇电子出射的理论模拟研究。 通过对俄歇电子在针尖电场作用下运动轨迹的模拟以及综合考虑从针尖场发射电子到俄歇电子出射全过程中各种因素的影响, 系统研究了针尖形状、 针尖偏压和针尖 样品距离对俄歇电子出射效率的影响, 以及出射俄歇电子束流密度在针尖电场区边缘处的分布。 研究结果为提高SPEES的收集效率、 空间分辨以及能量分辨提供了重要的参考数据。 The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported. By simulating the trajectory of Auger electrons, we systematically investigate the dependence of the emission efficiency of Auger electrons on the shape of tip, the biasing voltage, and the distance between the tip and sample surface, as well as the intensity distributions of Auger electrons at the edge of tip sample region. The results will be the significant reference for improving the sensitivity, spatial and energy resolutions of SPEEs.

关 键 词:扫描探针电子能谱仪    电子光学模拟    场发射    俄歇电子
收稿时间:1900-01-01

Simulation of Tip Parameters Influence on Electron Emission in SPEES
LI Ji-wei,XU Chun-kai,LIU Wen-jie,FANG Ke,CHEN Xiang-jun,XU Ke-zun.Simulation of Tip Parameters Influence on Electron Emission in SPEES[J].Nuclear Physics Review,2009,26(2):140-145.
Authors:LI Ji-wei  XU Chun-kai  LIU Wen-jie  FANG Ke  CHEN Xiang-jun  XU Ke-zun
Institution:Hefei National Laboratory for Physical Science at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China
Abstract:The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported. By simulating the trajectory of Auger electrons, we systematically investigate the dependence of the emission efficiency of Auger electrons on the shape of tip, the biasing voltage, and the distance between the tip and sample surface, as well as the intensity distributions of Auger electrons at the edge of tip-sample region. The results will be the significant reference for improving the sensit...
Keywords:scanning probe electron energy spectrometer  electro-optical simulation  field emission  Auger electron  
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