Angle-Resolved,Resonance-and Inverse-Photoemission Studies of Transition Metal Intercalated TiS2 |
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Authors: | Shigemasa Suga |
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Institution: | Graduate School of Engineering Science, Osaka University, Toyonaka , Osaka , 560-8531 , Japan |
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Abstract: | Abstract Electronic structures of transition metal intercalated IT-TiS2, MxTiS2, are studied by means of angle resolved photoemission, Ti 2p photoabsorption, 2p XPS, 2p resonance valence photoemission and ultraviolet inverse photoemission spectroscopy. Dispersions of the valence bands are noticeably modified from the host IT-TiS2. Several new features are interpreted and importance of the electron correlation and hybridization effects is confirmed. |
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Keywords: | MxTiS2 XPS core resonance angle-resolved photoemission band structures |
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