X-Ray Diffraction and Physical Properties of Potassium Fullerides KxC70 |
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| Authors: | Mototada Kobayashi Toshifumi Hara Kenichi Shiota Yuichi Akahama Haruki Kawamura Youichi Murakami |
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| Institution: | 1. Department of Material Science , Himeji Institute of Technology , Kamigohri , 678-1297 , Japan;2. Photon Factory , Institute of Material Structure Science, High Energy Accelerator Research Organization , Tsukuba , 305-0801 , Japan |
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| Abstract: | Abstract X-ray diffraction and magnetic-susceptibility measurements have been carried out for single phase KxC70 (x=1, 3, 4, 6 and 9) compounds synthesized by heating stoichiometric amount of K9C70 and C70. The x-ray diffraction profiles show no structural transition down to 10K. The fairly large temperature-independent paramagnetic contribution was observed in x=3 and 4. The electrical resistivity has been measured for K evaporated C70 film with increasing K thickness. Two resistivity minima were observed at x=1 and 4. |
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| Keywords: | C70 fulleride x-ray diffraction magnetic susceptibility resistivity |
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