Screen charge transfer by grounded tip on ferroelectric surfaces |
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| Authors: | Yunseok Kim Jiyoon Kim Simon Bühlmann Seungbum Hong Yong Kwan Kim Seung‐Hyun Kim Kwangsoo No |
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| Institution: | 1. Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305‐701, Korea;2. Semiconductor Device Laboratory, Samsung Advanced Institute of Technology, Yongin 446‐712, Korea;3. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA;4. Inostek Inc., Ansan 425‐791, Korea |
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| Abstract: | We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
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| Keywords: | 68 37 − d 77 22 Ej 77 84 Dy 77 90 +k |
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