| Abstract: | Non‐resonant inelastic X‐ray scattering of core electrons is a prominent tool for studying site‐selective, i.e. momentum‐transfer‐dependent, shallow absorption edges of liquids and samples under extreme conditions. A bottleneck of the analysis of such spectra is the appropriate subtraction of the underlying background owing to valence and core electron excitations. This background exhibits a strong momentum‐transfer dependence ranging from plasmon and particle–hole pair excitations to Compton scattering of core and valence electrons. In this work an algorithm to extract the absorption edges of interest from the superimposed background for a wide range of momentum transfers is presented and discussed for two examples, silicon and the compound silicondioxide. |
