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A twelve‐analyzer detector system for high‐resolution powder diffraction |
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| Authors: | Peter L. Lee Deming Shu Mohan Ramanathan Curt Preissner Jun Wang Mark A. Beno Robert B. Von Dreele Lynn Ribaud Charles Kurtz Sytle M. Antao Xuesong Jiao Brian H. Toby |
| Affiliation: | Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA |
| Abstract: | A dedicated high‐resolution high‐throughput X‐ray powder diffraction beamline has been constructed at the Advanced Photon Source (APS). In order to achieve the goals of both high resolution and high throughput in a powder instrument, a multi‐analyzer detector system is required. The design and performance of the 12‐analyzer detector system installed on the powder diffractometer at the 11‐BM beamline of APS are presented. |
| Keywords: | multi‐analyzer instrumentation powder diffraction |